{"title":"一种用于单事件瞬态检测的新型内置电流传感电路","authors":"Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang","doi":"10.1109/CCECE.2010.5575124","DOIUrl":null,"url":null,"abstract":"This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.","PeriodicalId":325063,"journal":{"name":"CCECE 2010","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":"{\"title\":\"A new Bulk Built-In Current Sensing circuit for single-event transient detection\",\"authors\":\"Zhichao Zhang, Tao Wang, Li Chen, Jinsheng Yang\",\"doi\":\"10.1109/CCECE.2010.5575124\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.\",\"PeriodicalId\":325063,\"journal\":{\"name\":\"CCECE 2010\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"35\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"CCECE 2010\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.2010.5575124\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"CCECE 2010","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.2010.5575124","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new Bulk Built-In Current Sensing circuit for single-event transient detection
This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.