L. Morescalchi, D. Caiulo, C. Franco, Di Falco Stefano, D. Simone, L. Leonardo, Pasciuto Daniele, Pedreschi Elena, Raffaelli Fabrizio, S. Franco, Cordelli Marco, Corradi Gianni, Diociaiuti Eleonora, Donghia Raffaella, Giovannella Simona, Happacher Fabio, Martini Martteo, Miscetti Stefano, Ricci Marco, S. Ivano, F. Anna, Müller Stefan, M. Nabil, Sia Radia, Pezzullo Gianantonio
{"title":"用于Mu2e量热计的定制硅光电倍增管特性的自动测试站","authors":"L. Morescalchi, D. Caiulo, C. Franco, Di Falco Stefano, D. Simone, L. Leonardo, Pasciuto Daniele, Pedreschi Elena, Raffaelli Fabrizio, S. Franco, Cordelli Marco, Corradi Gianni, Diociaiuti Eleonora, Donghia Raffaella, Giovannella Simona, Happacher Fabio, Martini Martteo, Miscetti Stefano, Ricci Marco, S. Ivano, F. Anna, Müller Stefan, M. Nabil, Sia Radia, Pezzullo Gianantonio","doi":"10.22323/1.343.0017","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":400748,"journal":{"name":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Automated Test Station for the Characterization of Custom Silicon PhotoMultipliers for the Mu2e Calorimeter\",\"authors\":\"L. Morescalchi, D. Caiulo, C. Franco, Di Falco Stefano, D. Simone, L. Leonardo, Pasciuto Daniele, Pedreschi Elena, Raffaelli Fabrizio, S. Franco, Cordelli Marco, Corradi Gianni, Diociaiuti Eleonora, Donghia Raffaella, Giovannella Simona, Happacher Fabio, Martini Martteo, Miscetti Stefano, Ricci Marco, S. Ivano, F. Anna, Müller Stefan, M. Nabil, Sia Radia, Pezzullo Gianantonio\",\"doi\":\"10.22323/1.343.0017\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":400748,\"journal\":{\"name\":\"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)\",\"volume\":\"85 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.22323/1.343.0017\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.22323/1.343.0017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}