扫描路径与直接复制和反向复制寄存器

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) Pub Date : 2002-04-28 DOI:10.1109/VTS.2002.1011110

M. Gössel, E. Sogomonyan, A. Singh

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引用次数: 2

摘要

本文提出了一种具有重复和反向重复存储元件的系统扫描路径设计方法。与已知的解决方案相反(Raina et al.， 2000)，不需要额外的多路复用器的额外控制线。验证了该扫描路径的完全可控性和可观测性。

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Scan-path with directly duplicated and inverted duplicated registers

In this paper a systematic scan-path design with duplicated and inverted duplicated memory elements is proposed. Contrary to a known solution (Raina et al., 2000), no additional control lines for additional multiplexors are needed. Full controllability and observability of the proposed scan-path is demonstrated.

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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

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