{"title":"RAMSES-FT:用于闪存测试和诊断的故障模拟器","authors":"Kuo-Liang Cheng, Jen-Chieh Yeh, Chih-Wea Wang, Chih-Tsun Huang, Cheng-Wen Wu","doi":"10.1109/vts.2002.1011153","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":237007,"journal":{"name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","volume":"191 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":"{\"title\":\"RAMSES-FT: a fault simulator for flash memory testing and diagnostics\",\"authors\":\"Kuo-Liang Cheng, Jen-Chieh Yeh, Chih-Wea Wang, Chih-Tsun Huang, Cheng-Wen Wu\",\"doi\":\"10.1109/vts.2002.1011153\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":237007,\"journal\":{\"name\":\"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)\",\"volume\":\"191 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"39\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/vts.2002.1011153\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/vts.2002.1011153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 39