新型瞬态检测电路检测显示面板中静电干扰的自动恢复设计

Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Che-Ming Yang, Shih-Fan Chen, Tung-Yang Chen
{"title":"新型瞬态检测电路检测显示面板中静电干扰的自动恢复设计","authors":"Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Che-Ming Yang, Shih-Fan Chen, Tung-Yang Chen","doi":"10.1109/DTIS.2011.5941441","DOIUrl":null,"url":null,"abstract":"A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.","PeriodicalId":409387,"journal":{"name":"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels\",\"authors\":\"Cheng-Cheng Yen, Wan-Yen Lin, M. Ker, Che-Ming Yang, Shih-Fan Chen, Tung-Yang Chen\",\"doi\":\"10.1109/DTIS.2011.5941441\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.\",\"PeriodicalId\":409387,\"journal\":{\"name\":\"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DTIS.2011.5941441\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2011.5941441","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种新的用于显示面板保护的系统级静电放电暂态干扰检测电路。该电路在系统级ESD测试中检测正负电瞬变的功能已经在HSPICE仿真中进行了评估,并在0.13 nm硅芯片上进行了验证。所提出的暂态检测电路的输出信号可以作为固件索引来执行系统自动恢复操作。通过硬件/固件系统协同设计,可以提高显示面板在系统级ESD测试中对瞬态干扰的抗扰能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
New transient detection circuit to detect ESD-induced disturbance for automatic recovery design in display panels
A new transient detection circuit against system-level electrostatic discharge (ESD) transient disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under system-level ESD tests has been evaluated in HSPICE simulation and verified in 0.13-nm silicon chip. The output signal of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware system co-design, the immunity of display panels against transient disturbance under system-level ESD tests can be enhanced.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信