D. Thomas, K. Biwojno, T. Xin, A. Nothofer, P. Sewell, C. Christopoulos
{"title":"微带线近场发射的测量与模拟","authors":"D. Thomas, K. Biwojno, T. Xin, A. Nothofer, P. Sewell, C. Christopoulos","doi":"10.1109/EMCEUROPE.2008.4786831","DOIUrl":null,"url":null,"abstract":"This paper presents results from measurements and simulations of near field scans above a microstrip line on a FR4 dielectric substrate. It is found that, through careful probe calibration, good agreement between measurement and simulation can be obtained up to 1 GHz. Above 1 GHz differences appear some due to physical features that are poorly quantified, particularly the dielectric loss associated with the FR4 substrate.","PeriodicalId":133902,"journal":{"name":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Measurement and simulation of near field emissions from microstrip lines\",\"authors\":\"D. Thomas, K. Biwojno, T. Xin, A. Nothofer, P. Sewell, C. Christopoulos\",\"doi\":\"10.1109/EMCEUROPE.2008.4786831\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents results from measurements and simulations of near field scans above a microstrip line on a FR4 dielectric substrate. It is found that, through careful probe calibration, good agreement between measurement and simulation can be obtained up to 1 GHz. Above 1 GHz differences appear some due to physical features that are poorly quantified, particularly the dielectric loss associated with the FR4 substrate.\",\"PeriodicalId\":133902,\"journal\":{\"name\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Symposium on Electromagnetic Compatibility - EMC Europe\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2008.4786831\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Symposium on Electromagnetic Compatibility - EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2008.4786831","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement and simulation of near field emissions from microstrip lines
This paper presents results from measurements and simulations of near field scans above a microstrip line on a FR4 dielectric substrate. It is found that, through careful probe calibration, good agreement between measurement and simulation can be obtained up to 1 GHz. Above 1 GHz differences appear some due to physical features that are poorly quantified, particularly the dielectric loss associated with the FR4 substrate.
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