{"title":"嵌入式高精度频率电容测量系统","authors":"L. Welter, P. Dreux, J. Portal, H. Aziza","doi":"10.1109/IOLTS.2013.6604061","DOIUrl":null,"url":null,"abstract":"This paper presents a direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator. A calibration system ensures robustness towards temperature, power supply and process variations. The measurement is largely automated to minimize the use of external instrumentation and to speed-up the measurement process while giving a digital signature of the capacitor value. Design-Of-Experiment (DOE) methodology has been conducted in order to validate the ability of the system to measure robustly a large range of small capacitors.","PeriodicalId":423175,"journal":{"name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","volume":"271 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Embedded high-precision frequency-based capacitor measurement system\",\"authors\":\"L. Welter, P. Dreux, J. Portal, H. Aziza\",\"doi\":\"10.1109/IOLTS.2013.6604061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator. A calibration system ensures robustness towards temperature, power supply and process variations. The measurement is largely automated to minimize the use of external instrumentation and to speed-up the measurement process while giving a digital signature of the capacitor value. Design-Of-Experiment (DOE) methodology has been conducted in order to validate the ability of the system to measure robustly a large range of small capacitors.\",\"PeriodicalId\":423175,\"journal\":{\"name\":\"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)\",\"volume\":\"271 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2013.6604061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2013.6604061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Embedded high-precision frequency-based capacitor measurement system
This paper presents a direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator. A calibration system ensures robustness towards temperature, power supply and process variations. The measurement is largely automated to minimize the use of external instrumentation and to speed-up the measurement process while giving a digital signature of the capacitor value. Design-Of-Experiment (DOE) methodology has been conducted in order to validate the ability of the system to measure robustly a large range of small capacitors.