S. Ohbayashi, M. Yabuuchi, K. Nii, Y. Tsukamoto, S. Imaoka, Y. Oda, M. Igarashi, M. Takeuchi, H. Kawashima, H. Makino, Y. Yamaguchi, K. Tsukamoto, M. Inuishi, K. Ishibashi, H. Shinohara
{"title":"一种65nm SoC嵌入式6T-SRAM设计，用于制造读写单元稳定电路","authors":"S. Ohbayashi, M. Yabuuchi, K. Nii, Y. Tsukamoto, S. Imaoka, Y. Oda, M. Igarashi, M. Takeuchi, H. Kawashima, H. Makino, Y. Yamaguchi, K. Tsukamoto, M. Inuishi, K. Ishibashi, H. Shinohara","doi":"10.1109/VLSIC.2006.1705290","DOIUrl":null,"url":null,"abstract":"We propose a new design scheme to improve the SRAM read and write operation margins in the presence of a large Vth variability. By applying this scheme to a 0.494 mum2 SRAM cell with a beta ratio of 1, which is an aggressively small cell size, we can achieve a high-yield 8M-SRAM for a wide range of Vth value using a 65 nm LSTP CMOS technology","PeriodicalId":366835,"journal":{"name":"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"52","resultStr":"{\"title\":\"A 65 nm SoC Embedded 6T-SRAM Design for Manufacturing with Read and Write Cell Stabilizing Circuits\",\"authors\":\"S. Ohbayashi, M. Yabuuchi, K. Nii, Y. Tsukamoto, S. Imaoka, Y. Oda, M. Igarashi, M. Takeuchi, H. Kawashima, H. Makino, Y. Yamaguchi, K. Tsukamoto, M. Inuishi, K. Ishibashi, H. Shinohara\",\"doi\":\"10.1109/VLSIC.2006.1705290\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose a new design scheme to improve the SRAM read and write operation margins in the presence of a large Vth variability. By applying this scheme to a 0.494 mum2 SRAM cell with a beta ratio of 1, which is an aggressively small cell size, we can achieve a high-yield 8M-SRAM for a wide range of Vth value using a 65 nm LSTP CMOS technology\",\"PeriodicalId\":366835,\"journal\":{\"name\":\"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"52\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2006.1705290\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2006.1705290","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 65 nm SoC Embedded 6T-SRAM Design for Manufacturing with Read and Write Cell Stabilizing Circuits
We propose a new design scheme to improve the SRAM read and write operation margins in the presence of a large Vth variability. By applying this scheme to a 0.494 mum2 SRAM cell with a beta ratio of 1, which is an aggressively small cell size, we can achieve a high-yield 8M-SRAM for a wide range of Vth value using a 65 nm LSTP CMOS technology
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