利用探针耦合型微带线谐振器测量超导体表面阻抗的新技术

D. Okai, M. Kusunoki, M. Mukaida, S. Ohshima
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引用次数: 6

摘要

我们开发了一种用于超导体表面阻抗精确测量的探针耦合型微带线谐振器方法。通过这种改进的微带状线谐振器方法,可以在不附加任何触点的情况下测量表面阻抗。本文报道了用探针耦合型微带线谐振器精确、可重复地测量表面阻抗的过程。用这种方法测量了YBCO薄膜的表面阻抗。测量结果表明,该方法可用于表面阻抗的精确测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
New measurement technique of the surface impedance of superconductors using the probe-coupling type microstripline resonator
We have developed a probe-coupling type microstripline resonator method for accurate measurement of the surface impedance of superconductors. By this improved microstripline resonator method, the surface impedance can be measured without attaching any contacts to the film. This paper reports the accurate and reproducible measurement process of surface impedance using the probe-coupling type microstripline resonator. The surface impedance of a YBCO thin film was measured using this technique. The measured results revealed that this technique may be used for the accurate measurement of surface impedance.
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