商用继电器在中低功率接触负荷寿命试验中的可靠性

W. Rieder, T. Strof
{"title":"商用继电器在中低功率接触负荷寿命试验中的可靠性","authors":"W. Rieder, T. Strof","doi":"10.1109/HOLM.1991.170809","DOIUrl":null,"url":null,"abstract":"The influence of the electrical stress on the contact resistance behavior of several signal and power relays has been investigated during life tests comprising 2 million operations. The results obtained with the aid of a specially developed test device showed characteristic contact resistance patterns for different electrical loads, contact materials, and designs. Under certain load conditions the contact resistance is increased by carbon deposits while both lower and higher loads caused lower contact resistance values.<<ETX>>","PeriodicalId":368900,"journal":{"name":"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Reliability of commercial relays during life tests with intermediate or low power contact load\",\"authors\":\"W. Rieder, T. Strof\",\"doi\":\"10.1109/HOLM.1991.170809\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of the electrical stress on the contact resistance behavior of several signal and power relays has been investigated during life tests comprising 2 million operations. The results obtained with the aid of a specially developed test device showed characteristic contact resistance patterns for different electrical loads, contact materials, and designs. Under certain load conditions the contact resistance is increased by carbon deposits while both lower and higher loads caused lower contact resistance values.<<ETX>>\",\"PeriodicalId\":368900,\"journal\":{\"name\":\"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1991.170809\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1991.170809","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

在200万次的寿命试验中,研究了电应力对几种信号和功率继电器接触电阻行为的影响。借助专门开发的测试装置获得的结果显示了不同电负载、触点材料和设计的特征接触电阻模式。在一定负载条件下,积碳会使接触电阻值增加,而低负荷和高负荷都会使接触电阻值降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability of commercial relays during life tests with intermediate or low power contact load
The influence of the electrical stress on the contact resistance behavior of several signal and power relays has been investigated during life tests comprising 2 million operations. The results obtained with the aid of a specially developed test device showed characteristic contact resistance patterns for different electrical loads, contact materials, and designs. Under certain load conditions the contact resistance is increased by carbon deposits while both lower and higher loads caused lower contact resistance values.<>
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