热声键合:区域阵列焊料连接的替代方案

S. Kang, T. Ju, Y.C. Lee
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引用次数: 11

摘要

用于倒装芯片、贴片或表面贴装技术的热声键合是焊接连接的潜在替代品。它们是干法工艺,具有低成本、简单和精细的优点。如果解决了装配良率和可靠性这两个主要问题,这些新连接技术的应用有望得到增长。本文研究了装配问题。众所周知,利用超声波能量可以大大简化金属键合过程。然而,区域阵列连接的热超声过程窗口的变化是不可控的;这项技术发展的进展并不令人鼓舞。采用30- i /O和1000-I/O芯片的倒装键合案例,研究了刀具配置和质量对良率的影响。屈臣率与金属凸起的超声振幅密切相关。对于30-I/O芯片,与良好键合过程相关的振幅约为1.30 /spl mu/m。然而,当将模具夹头扩大到1000-I/O芯片时,可以将其降低到0.26 /spl mu/m。幸运的是,这种减少可以通过改变夹头的质量和柄的长度的设计来克服。本文将通过实验和模型研究来阐述对这些效应的理解和控制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermosonic bonding: an alternative to area-array solder connections
Thermosonic bondings for flip-chip, TAB, or surface mount technologies are potential alternatives to solder connections. They are dry processes having low-cost, simplicity, and fine-pitch advantages. The applications of these new connection technologies are expected to grow if their two major problems, assembly yield and reliability, are solved. The assembly problem is studied in this paper. It is well known that the use of ultrasonic energy can significantly simplify metal bonding processes. However, the changes of thermosonic process windows for area-array connections are not controllable; the progress of this technology development is not encouraging. Using flip-chip bonding cases with 30- and 1000-I/O chips, this work studies the effects on yields from tool configurations and masses. The yield is closely related to the ultrasonic amplitude of metal bumps. The amplitude associated with a good bonding process for a 30-I/O chip is about 1.30 /spl mu/m. However, it could be reduced to 0.26 /spl mu/m when the die collet is enlarged for a 1000-I/O chip. Fortunately, such a reduction can be overcome by a design that changes the mass of the collet and the length of the shank. This paper will address the understanding and the control of these effects with experimental and modeling studies.<>
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