In Search of a More Realistic Accuracy Statement for Microwave Metrology

Historically, the accuracy achieved by the microwave metrologist has been limited by detector performance, hardware imperfections, and connector problems. Today the effect of hardware imperfections has, in many cases, been eliminated by more complete modeling as is found in the typical vector network analyzer. Moreover, the performance of the detection systems has been improved to the point where in many cases the nonideal connector behavior is the major error source. This is not to suggest that the connector art has remained static. To the contrary, important refinements have been realized and more are in the offing. however, that these refinements have not kept pace with the other developments. It is still quite possible,