预测了4500v超级多路复用mosfet的电特性

11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) Pub Date : 1999-05-26 DOI:10.1109/ISPSD.1999.764066

Y. Kawaguchi, K. Nakamura, A. Yahata, A. Nakagawa

{"title":"预测了4500v超级多路复用mosfet的电特性","authors":"Y. Kawaguchi, K. Nakamura, A. Yahata, A. Nakagawa","doi":"10.1109/ISPSD.1999.764066","DOIUrl":null,"url":null,"abstract":"In this paper, we show the optimized device parameters for various voltage multi-RESURF devices based on exact simulation. In addition, we also present, for the first time, the exact static and transient simulation of a 4500 V multi-RESURF device. The distinguishing feature of the multi-RESURF MOSFET is that a storage time exists and that the fall time is extremely small. The multi-RESURF MOSFET was found to be an ideal device for high voltage applications, superior to IGBTs.","PeriodicalId":352185,"journal":{"name":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"Predicted electrical characteristics of 4500 V super multi-RESURF MOSFETs\",\"authors\":\"Y. Kawaguchi, K. Nakamura, A. Yahata, A. Nakagawa\",\"doi\":\"10.1109/ISPSD.1999.764066\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we show the optimized device parameters for various voltage multi-RESURF devices based on exact simulation. In addition, we also present, for the first time, the exact static and transient simulation of a 4500 V multi-RESURF device. The distinguishing feature of the multi-RESURF MOSFET is that a storage time exists and that the fall time is extremely small. The multi-RESURF MOSFET was found to be an ideal device for high voltage applications, superior to IGBTs.\",\"PeriodicalId\":352185,\"journal\":{\"name\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1999.764066\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1999.764066","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 20

摘要

本文在精确仿真的基础上，给出了各种电压多路复用器件的优化参数。此外，我们还首次提出了一个4500 V多路复用电路器件的精确静态和瞬态仿真。多路复用MOSFET的显著特点是存在存储时间，且下降时间极小。该多路复用MOSFET被认为是高压应用的理想器件，优于igbt。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Predicted electrical characteristics of 4500 V super multi-RESURF MOSFETs

In this paper, we show the optimized device parameters for various voltage multi-RESURF devices based on exact simulation. In addition, we also present, for the first time, the exact static and transient simulation of a 4500 V multi-RESURF device. The distinguishing feature of the multi-RESURF MOSFET is that a storage time exists and that the fall time is extremely small. The multi-RESURF MOSFET was found to be an ideal device for high voltage applications, superior to IGBTs.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)

自引率

0.00%

发文量