{"title":"商用现成介质隔离JFET运算放大器辐照期间的剂量率和总剂量噪声性能","authors":"D. Hiemstra","doi":"10.1109/REDW.1996.574181","DOIUrl":null,"url":null,"abstract":"The noise performance in a dose rate environment of a dielectrically isolated JFET operational amplifier at the onset of irradiation and with respect to total dose is presented. Comparison to previously reported results are made.","PeriodicalId":196196,"journal":{"name":"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation\",\"authors\":\"D. Hiemstra\",\"doi\":\"10.1109/REDW.1996.574181\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The noise performance in a dose rate environment of a dielectrically isolated JFET operational amplifier at the onset of irradiation and with respect to total dose is presented. Comparison to previously reported results are made.\",\"PeriodicalId\":196196,\"journal\":{\"name\":\"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-07-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.1996.574181\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1996.574181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation
The noise performance in a dose rate environment of a dielectrically isolated JFET operational amplifier at the onset of irradiation and with respect to total dose is presented. Comparison to previously reported results are made.