mosfet SEB和SEGR鉴定结果与SOA估计

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696132

Sergey A. Iakovlev, V. Anashin, P. Chubunov, A. Koziukov, Kais B. Bu-Khasan, T. A. Maksimenko, A. M. Chlenov

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引用次数: 3

摘要

本文介绍了2016年10月在俄罗斯联邦航天局SEE测试设施测试期间获得的一些商用功率mosfet的单事件效应(SEE)测试结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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MOSFETs SEB & SEGR Qualification Results with SOA Estimation

the paper presents single event effects (SEE) test results for some commercial power MOSFETs obtained at Roscosmos SEE Test Facilities during test campaign in October 2016.

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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