{"title":"NCUBE:迭代逻辑阵列自动测试生成程序","authors":"A. Chatterjee, J. Abraham","doi":"10.1109/ICCAD.1988.122542","DOIUrl":null,"url":null,"abstract":"NCUBE applies all possible input patterns to each array cell while ensuring that the effects of incorrect transitions are observable at the array outputs. If the array is testable with a constant number of test vectors irrespective of its size (C-testable), then NCUBE generates the constant-size test set for the array. If the array cannot be tested with a constant number of test vectors, then the test size is proportional either to the number of rows or columns of the array or to the number of cells. In that case, NCUBE generates a minimal or near-minimal test set that depends on the size of the array.<<ETX>>","PeriodicalId":285078,"journal":{"name":"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"NCUBE: an automatic test generation program for iterative logic arrays\",\"authors\":\"A. Chatterjee, J. Abraham\",\"doi\":\"10.1109/ICCAD.1988.122542\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"NCUBE applies all possible input patterns to each array cell while ensuring that the effects of incorrect transitions are observable at the array outputs. If the array is testable with a constant number of test vectors irrespective of its size (C-testable), then NCUBE generates the constant-size test set for the array. If the array cannot be tested with a constant number of test vectors, then the test size is proportional either to the number of rows or columns of the array or to the number of cells. In that case, NCUBE generates a minimal or near-minimal test set that depends on the size of the array.<<ETX>>\",\"PeriodicalId\":285078,\"journal\":{\"name\":\"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers\",\"volume\":\"112 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1988.122542\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1988.122542","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
NCUBE: an automatic test generation program for iterative logic arrays
NCUBE applies all possible input patterns to each array cell while ensuring that the effects of incorrect transitions are observable at the array outputs. If the array is testable with a constant number of test vectors irrespective of its size (C-testable), then NCUBE generates the constant-size test set for the array. If the array cannot be tested with a constant number of test vectors, then the test size is proportional either to the number of rows or columns of the array or to the number of cells. In that case, NCUBE generates a minimal or near-minimal test set that depends on the size of the array.<>