贯穿连接器外壳的电磁泄漏特性

2007 IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2007-05-13 DOI:10.1109/SPI.2007.4512224

Y. Bouri, L. Koné, J. Razafiarivelo, D. Baudry, S. Baranowski, B. Démoulin

{"title":"贯穿连接器外壳的电磁泄漏特性","authors":"Y. Bouri, L. Koné, J. Razafiarivelo, D. Baudry, S. Baranowski, B. Démoulin","doi":"10.1109/SPI.2007.4512224","DOIUrl":null,"url":null,"abstract":"The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms of current and voltage induced on the line.","PeriodicalId":206352,"journal":{"name":"2007 IEEE Workshop on Signal Propagation on Interconnects","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterization of electromagnetic leakages throughout the connector shell\",\"authors\":\"Y. Bouri, L. Koné, J. Razafiarivelo, D. Baudry, S. Baranowski, B. Démoulin\",\"doi\":\"10.1109/SPI.2007.4512224\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms of current and voltage induced on the line.\",\"PeriodicalId\":206352,\"journal\":{\"name\":\"2007 IEEE Workshop on Signal Propagation on Interconnects\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Workshop on Signal Propagation on Interconnects\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI.2007.4512224\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Workshop on Signal Propagation on Interconnects","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2007.4512224","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文讨论了由于孔和槽的存在而导致的连接器屏蔽电磁泄漏的分析方法。本文将提出一些实验和数值结果，从线路上感应电流和电压的角度来评估连接器孔径与PCB走线之间的电磁耦合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Characterization of electromagnetic leakages throughout the connector shell

The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms of current and voltage induced on the line.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2007 IEEE Workshop on Signal Propagation on Interconnects

自引率

0.00%

发文量