内置硬件模拟电路测试

2008 Electronics, Robotics and Automotive Mechanics Conference (CERMA '08) Pub Date : 2008-09-30 DOI:10.1109/CERMA.2008.7

M. Assaf, M. Fathi

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引用次数: 8

摘要

测试模拟电路是一项具有挑战性的工作。本课题研究了基于振荡的内置自检(OBIST)技术对模拟电路的测试。考虑并实现了一种基于OBIST方法的模拟电路测试环境。实验结果表明，OBIST是一种很有前途的模拟电路测试方法，既不需要刺激发生器，也不需要复杂的结果分析仪。

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Built-In Hardware for Analog Circuitry Testing

Testing analog circuits is a challenging endeavor. The subject paper investigates the oscillation-based built-in self-test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.

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2008 Electronics, Robotics and Automotive Mechanics Conference (CERMA '08)

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