{"title":"屏蔽和耦合传输线电容的计算","authors":"S. Musa, M. Sadiku","doi":"10.1109/TPSD.2008.4562726","DOIUrl":null,"url":null,"abstract":"In this paper, we present the modeling of shielded three vertically coupled striplines and shielded four coupled microstrip lines embedded in a dielectric material media using finite element method (FEM). We specifically determine the capacitance per unit length of shielded three vertically coupled striplines and shielded four coupled microstrip lines embedded in a dielectric material. We compare our results with those obtained by method of lines (MoL) and found them to be in good agreement.","PeriodicalId":410786,"journal":{"name":"2008 IEEE Region 5 Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Computation of Capacitance of Shielded and Coupled Transmission Lines\",\"authors\":\"S. Musa, M. Sadiku\",\"doi\":\"10.1109/TPSD.2008.4562726\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present the modeling of shielded three vertically coupled striplines and shielded four coupled microstrip lines embedded in a dielectric material media using finite element method (FEM). We specifically determine the capacitance per unit length of shielded three vertically coupled striplines and shielded four coupled microstrip lines embedded in a dielectric material. We compare our results with those obtained by method of lines (MoL) and found them to be in good agreement.\",\"PeriodicalId\":410786,\"journal\":{\"name\":\"2008 IEEE Region 5 Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Region 5 Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TPSD.2008.4562726\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Region 5 Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TPSD.2008.4562726","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Computation of Capacitance of Shielded and Coupled Transmission Lines
In this paper, we present the modeling of shielded three vertically coupled striplines and shielded four coupled microstrip lines embedded in a dielectric material media using finite element method (FEM). We specifically determine the capacitance per unit length of shielded three vertically coupled striplines and shielded four coupled microstrip lines embedded in a dielectric material. We compare our results with those obtained by method of lines (MoL) and found them to be in good agreement.