C. Jung, Se-Yun Kim, Hee-Yul Lee, B. Yun, Joon-Jae Lee, Young-Do Lim, Kil-Houm Park
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Fourier spectrum based periodic cell pattern elimination in thin film transistor liquid crystal display cell image
This paper presents a hardware that inspects defects on TFT-LCD cell modules and packed in a PCI-board equipped with FPGA and DSP processors. Images of TFT-LCD cell modules normally contain periodic cell patterns which make it difficult to detect defects. We propose an efficient and powerful algorithm for elimination of the cell pattern using magnitude spectrum analysis.