{"title":"结合二维TLM的电源-地平面垂直互连射频建模","authors":"R. Ito, R. Carrillo-Ramirez, R. Jackson","doi":"10.1109/EPEP.2001.967677","DOIUrl":null,"url":null,"abstract":"In this paper, we present a modeling technique for finding a lumped element model of a via interconnection that can be used in conjunction with a coarse grid two-dimensional transmission line matrix method (2D-TLM) analysis. The technique allows the use of very simple 2D TLM analysis to simultaneously compute insertion loss, return loss, and isolation of multiple via transitions through a power-ground plane pair in a multilayer package. The accuracy of this technique is validated by comparison to HFSS.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"RF modeling of vertical interconnection between power-ground plane combined with 2D TLM\",\"authors\":\"R. Ito, R. Carrillo-Ramirez, R. Jackson\",\"doi\":\"10.1109/EPEP.2001.967677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a modeling technique for finding a lumped element model of a via interconnection that can be used in conjunction with a coarse grid two-dimensional transmission line matrix method (2D-TLM) analysis. The technique allows the use of very simple 2D TLM analysis to simultaneously compute insertion loss, return loss, and isolation of multiple via transitions through a power-ground plane pair in a multilayer package. The accuracy of this technique is validated by comparison to HFSS.\",\"PeriodicalId\":174339,\"journal\":{\"name\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2001.967677\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF modeling of vertical interconnection between power-ground plane combined with 2D TLM
In this paper, we present a modeling technique for finding a lumped element model of a via interconnection that can be used in conjunction with a coarse grid two-dimensional transmission line matrix method (2D-TLM) analysis. The technique allows the use of very simple 2D TLM analysis to simultaneously compute insertion loss, return loss, and isolation of multiple via transitions through a power-ground plane pair in a multilayer package. The accuracy of this technique is validated by comparison to HFSS.