{"title":"工业连续式微波炉阻抗自动匹配系统的设计。第二部分:实验结果","authors":"V. Parro, F. Pait","doi":"10.1109/IMOC.2003.1242681","DOIUrl":null,"url":null,"abstract":"The algorithm proposed in part I (see ibid., p.791-5) was carried out in an experimental test. This test is elaborated in order to make a fine tuning of the algorithm parameters and analyze the results. An artificial load was used, composed of a matched load with a mismatched device. The mismatch was obtained by varying the length of four screws positioned in a rectangular waveguide.","PeriodicalId":156662,"journal":{"name":"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Design of an automatic impedance matching system for industrial continuous microwave ovens. Part II: experimental results\",\"authors\":\"V. Parro, F. Pait\",\"doi\":\"10.1109/IMOC.2003.1242681\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The algorithm proposed in part I (see ibid., p.791-5) was carried out in an experimental test. This test is elaborated in order to make a fine tuning of the algorithm parameters and analyze the results. An artificial load was used, composed of a matched load with a mismatched device. The mismatch was obtained by varying the length of four screws positioned in a rectangular waveguide.\",\"PeriodicalId\":156662,\"journal\":{\"name\":\"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMOC.2003.1242681\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMOC.2003.1242681","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of an automatic impedance matching system for industrial continuous microwave ovens. Part II: experimental results
The algorithm proposed in part I (see ibid., p.791-5) was carried out in an experimental test. This test is elaborated in order to make a fine tuning of the algorithm parameters and analyze the results. An artificial load was used, composed of a matched load with a mismatched device. The mismatch was obtained by varying the length of four screws positioned in a rectangular waveguide.