不同eva层状硅酸盐纳米结构化合物的电树结构研究

Conference Record of the 2006 IEEE International Symposium on Electrical Insulation Pub Date : 2006-06-11 DOI:10.1109/ELINSL.2006.1665360

F. Guastavino, A. Dardano, G. Montanari, F. Deorsola, M.D.L. del Casale

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引用次数: 17

摘要

聚合物绝缘中的电树是一种潜在的纳米结构依赖现象。本工作是不同形貌的eva层状硅酸盐纳米复合材料电树的初步研究的一部分。主要考虑两个参数:树起始电压(TIV)和击穿电压(BDV)。这些参数，特别是TIV在插层纳米复合材料中表现出显著的增加。这些结果加强了由于纳米结构而产生的界面相互作用可以提高聚合物的耐树性的概念

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A study about electrical treeing in different EVA-layered silicate nanostructured compounds

Electrical treeing in polymeric insulation is potentially a nano-structure dependent phenomenon. The present work is part of a preliminary study on electrical treeing in EVA-layered silicate nanocomposites having different morphology. Two parameters have been mainly considered: the treeing inception voltage (TIV) and the breakdown voltage (BDV). These parameters, especially the TIV, have shown a significant increase in the intercalated nanocomposite materials. The outcomes strengthen the concept that interface interactions due to the nanostructure can improve the treeing resistance of polymeric compounds

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Conference Record of the 2006 IEEE International Symposium on Electrical Insulation

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