{"title":"多发射极功率NPN晶体管的电热特性","authors":"A. Bajenaru, C. Boianceanu, G. Brezeanu","doi":"10.1109/OPTIM.2014.6851018","DOIUrl":null,"url":null,"abstract":"This paper presents a method to characterize the electro-thermal behavior of power NPN transistors in the presence of temperature gradients that mimic the functioning conditions of the device in circuits like linear voltage regulators. A test structure able to generate the temperature variations over the power device and a measurement setup are presented. The entire structure is then modeled in a 3D thermal simulator and used to recreate the measurement conditions and explain the measured temperature profiles.","PeriodicalId":298237,"journal":{"name":"2014 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM)","volume":"22 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electro-thermal characterization of multi-emitter power NPN transistors\",\"authors\":\"A. Bajenaru, C. Boianceanu, G. Brezeanu\",\"doi\":\"10.1109/OPTIM.2014.6851018\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method to characterize the electro-thermal behavior of power NPN transistors in the presence of temperature gradients that mimic the functioning conditions of the device in circuits like linear voltage regulators. A test structure able to generate the temperature variations over the power device and a measurement setup are presented. The entire structure is then modeled in a 3D thermal simulator and used to recreate the measurement conditions and explain the measured temperature profiles.\",\"PeriodicalId\":298237,\"journal\":{\"name\":\"2014 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM)\",\"volume\":\"22 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OPTIM.2014.6851018\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OPTIM.2014.6851018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electro-thermal characterization of multi-emitter power NPN transistors
This paper presents a method to characterize the electro-thermal behavior of power NPN transistors in the presence of temperature gradients that mimic the functioning conditions of the device in circuits like linear voltage regulators. A test structure able to generate the temperature variations over the power device and a measurement setup are presented. The entire structure is then modeled in a 3D thermal simulator and used to recreate the measurement conditions and explain the measured temperature profiles.