分层方法设计系统测试接口

Proceedings. 21st VLSI Test Symposium, 2003. Pub Date : 2003-04-27 DOI:10.1109/VTEST.2003.1197671

Man Wah Chiang, Z. Zilic

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引用次数: 1

摘要

分层系统设计方法在网络和其他复杂系统的设计中显示了它的优势。在本文中，我们将这种方法应用于系统测试接口的设计。该系统被划分为多个层，以最大限度地重用和简化开发。在本文中，我们通过为Infiniband架构(IBA)设计一个低开销的测试接口和电路来演示这种方法。

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Layered approach to designing system test interfaces

The layered system design approach has shown its strength in the design of the network and other complex systems. In this paper, we apply this approach to the design of system testing interfaces. The system is partitioned into layers to maximize reuse, and ease the development. In this paper, we demonstrate this methodology by designing a low-overhead testing interface and circuitry for the Infiniband Architecture (IBA).

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Proceedings. 21st VLSI Test Symposium, 2003.

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