{"title":"电子封装系统设计中包含ISI效应的最坏情况串扰和最坏情况睁眼效应的预测","authors":"Zhaoqing Chen","doi":"10.1109/EPEP.2007.4387149","DOIUrl":null,"url":null,"abstract":"New methods for predicting the worst-case crosstalk caused by intersymbol interference and the worst-case eye opening including crosstalk effect are proposed. The new method for predicting the worst-case crosstalk is based on simulated or measured crosstalk caused by a single bit aggressor signal. By using the derived worst-case crosstalk and the no-crosstalk worst-case eye opening, we can get worst-case eye opening including crosstalk effect. The proposed methods are exactly valid for packaging component and system with linear I/O devices as the signal source and load. They can also be extended to some nonlinear I/O cases with approximations.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Predictions of the Worst-Case Crosstalk Including ISI Effect and the Worst-Case Eye Opening Including Crosstalk Effect for Electronic Packaging System Design\",\"authors\":\"Zhaoqing Chen\",\"doi\":\"10.1109/EPEP.2007.4387149\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New methods for predicting the worst-case crosstalk caused by intersymbol interference and the worst-case eye opening including crosstalk effect are proposed. The new method for predicting the worst-case crosstalk is based on simulated or measured crosstalk caused by a single bit aggressor signal. By using the derived worst-case crosstalk and the no-crosstalk worst-case eye opening, we can get worst-case eye opening including crosstalk effect. The proposed methods are exactly valid for packaging component and system with linear I/O devices as the signal source and load. They can also be extended to some nonlinear I/O cases with approximations.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387149\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Predictions of the Worst-Case Crosstalk Including ISI Effect and the Worst-Case Eye Opening Including Crosstalk Effect for Electronic Packaging System Design
New methods for predicting the worst-case crosstalk caused by intersymbol interference and the worst-case eye opening including crosstalk effect are proposed. The new method for predicting the worst-case crosstalk is based on simulated or measured crosstalk caused by a single bit aggressor signal. By using the derived worst-case crosstalk and the no-crosstalk worst-case eye opening, we can get worst-case eye opening including crosstalk effect. The proposed methods are exactly valid for packaging component and system with linear I/O devices as the signal source and load. They can also be extended to some nonlinear I/O cases with approximations.
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