具有温度不敏感带隙的新型半导体合金GaAs/sub - 1-x/Bi/sub -x的光学跃迁

J. Yoshida, H. Yamamizu, T. Kita, K. Oe
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引用次数: 1

摘要

为了研究GaAs/sub - 1-x/Bi/sub -x/合金的基本带边跃迁,我们使用了光反射(PR)光谱。本文研究的GaAs/sub - 1-x/Bi/sub -x/的gabi -摩尔分数分别为0、0.005、0.012和0.024。由于内置电场的作用,四个样品的PR谱表现出高于带隙能量的弗兰兹-凯尔迪什振荡(FKO)。FKO信号使我们能够评估带隙能量。我们发现,少量的铋含量成功地产生了温度不敏感的带隙。通过快速傅里叶变换对PR光谱进行了估计,得到了重空穴带和轻空穴带之间的有效质量比/spl mu//sub hh///spl mu//sub lh/。结果表明,Bi含量越高,/spl mu//sub hh///spl mu//sub lh/越大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optical transitions in new semiconductor alloy GaAs/sub 1-x/Bi/sub x/ with temperature-insensitive band gap
We performed photoreflectance (PR) spectroscopy in order to investigate fundamental band-edge transitions of GaAs/sub 1-x/Bi/sub x/ alloys. GaBi-mole fractions of GaAs/sub 1-x/Bi/sub x/ investigated in this study are 0, 0.005, 0.012 and 0.024. The PR spectra for the four samples exhibit Franz-Keldysh oscillations (FKO) above the band-gap energy due to the built-in electric field. The FKO signal enables us to evaluate the band-gap energy. We found that a small amount of the Bi content succeeds in producing a temperature-insensitive band gap. The reduced effective mass ratio between the heavy- and light-hole bands /spl mu//sub hh///spl mu//sub lh/ was estimated by fast Fourier-transform analysis for the PR spectra. These results show that /spl mu//sub hh///spl mu//sub lh/ is larger for higher Bi content.
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