肖特基二极管参数提取采用两种不同的方法

S. Aazou, E. Assaid
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引用次数: 8

摘要

在本研究中,我们确定了通过肖特基势垒二极管的电流作为输入电压函数的精确解析表达式。肖特基二极管由包含四个物理参数的电子电路建模:串联电阻Rs、并联电阻Rsh、肖特基二极管反向饱和电流is和肖特基二极管理想因数η。首先,利用LambertW函数求解肖特基二极管的特征方程,确定输入电流I随输入电压V的解析表达式。其次,我们提出了两种不同的方法来提取电子电路中出现的四个物理参数。这些方法应用于两个结:200K的铱-碳化硅肖特基势垒二极管和300K的砷化金镓。最后,对两种方法的结果进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Schottky diode parameters extraction using two different methods
In the present study, we determine exact analytical expression of the current flow through a Schottky barrier diode as a function of the input voltage. The Schottky diode is modeled by an electronic circuit containing four physical parameters: a series resistance Rs, a shunt resistance Rsh, a Schottky diode reverse saturation current Is and a Schottky diode ideality factor η. Firstly, we solve the characteristic equation and determine the analytical expression of the input current I as a function of the input voltage of the Schottky diode V using the LambertW Function. Secondly, We present two different methods to extract the four physical parameters appearing in the electronic circuit. These methods are applied for two junctions: Iridium-Silicon Carbide Schottky barrier diode at 200K and Gold-Gallium Arsenide at 300K. Finally, we compare the results obtained via the two methods presented.
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