T. Ibuchi, Eisuke Masuda, T. Funaki, H. Otake, T. Miyazaki, Yasuo Kanetake, Takashi Nakamura
{"title":"基于近场磁扫描技术的SiC功率模块封装设计研究","authors":"T. Ibuchi, Eisuke Masuda, T. Funaki, H. Otake, T. Miyazaki, Yasuo Kanetake, Takashi Nakamura","doi":"10.1109/IWIPP.2017.7936770","DOIUrl":null,"url":null,"abstract":"This report focuses the current distribution in a module identifiedwith magnetic near-field intensity for optimizing layout and packaging design of silicon carbide (SiC) power module. This measurement methodology can visualize the practical current distribution on a wiring pattern in a module and can estimate the effect of snubber capacitor in a DC-link of half-bridge to suppress the voltage overshoot and ringing oscillation.","PeriodicalId":164552,"journal":{"name":"2017 IEEE International Workshop On Integrated Power Packaging (IWIPP)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"A study on packaging design of SiC power module using near-field magnetic scanning techniques\",\"authors\":\"T. Ibuchi, Eisuke Masuda, T. Funaki, H. Otake, T. Miyazaki, Yasuo Kanetake, Takashi Nakamura\",\"doi\":\"10.1109/IWIPP.2017.7936770\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This report focuses the current distribution in a module identifiedwith magnetic near-field intensity for optimizing layout and packaging design of silicon carbide (SiC) power module. This measurement methodology can visualize the practical current distribution on a wiring pattern in a module and can estimate the effect of snubber capacitor in a DC-link of half-bridge to suppress the voltage overshoot and ringing oscillation.\",\"PeriodicalId\":164552,\"journal\":{\"name\":\"2017 IEEE International Workshop On Integrated Power Packaging (IWIPP)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Workshop On Integrated Power Packaging (IWIPP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWIPP.2017.7936770\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Workshop On Integrated Power Packaging (IWIPP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWIPP.2017.7936770","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A study on packaging design of SiC power module using near-field magnetic scanning techniques
This report focuses the current distribution in a module identifiedwith magnetic near-field intensity for optimizing layout and packaging design of silicon carbide (SiC) power module. This measurement methodology can visualize the practical current distribution on a wiring pattern in a module and can estimate the effect of snubber capacitor in a DC-link of half-bridge to suppress the voltage overshoot and ringing oscillation.