{"title":"动态比较器输入参考噪声的测量时间缩减技术","authors":"Yukiko Ishijima, S. Nakagawa, H. Ishikuro","doi":"10.1109/ICMTS.2018.8383799","DOIUrl":null,"url":null,"abstract":"Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.","PeriodicalId":271839,"journal":{"name":"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Measurement time reduction technique for input referred noise of dynamic comparator\",\"authors\":\"Yukiko Ishijima, S. Nakagawa, H. Ishikuro\",\"doi\":\"10.1109/ICMTS.2018.8383799\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.\",\"PeriodicalId\":271839,\"journal\":{\"name\":\"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2018.8383799\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2018.8383799","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement time reduction technique for input referred noise of dynamic comparator
Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.