{"title":"功率门控逻辑簇唤醒时间估计的半经验模型","authors":"Vivek D. Tovinakere, O. Sentieys, Steven Derrien","doi":"10.1145/2228360.2228371","DOIUrl":null,"url":null,"abstract":"Wakeup time is an important overhead that must be determined for effective power gating, particularly in logic clusters that undergo frequent mode transitions for run-time leakage power reduction. In this paper, a semiempirical model for virtual supply voltage in terms of basic parameters of the power-gated circuit is presented. Hence a closed-form expression for estimation of wakeup time of a power-gated logic cluster is derived. Experimental results of application of the model to ISCAS85 benchmark circuits show that wakeup time may be estimated within an average error of 16.3% across 22× variation in sleep transistor sizes and 13× variation in circuit sizes with significant speedup in computation time compared to SPICE level circuit simulations.","PeriodicalId":263599,"journal":{"name":"DAC Design Automation Conference 2012","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"A semiempirical model for wakeup time estimation in power-gated logic clusters\",\"authors\":\"Vivek D. Tovinakere, O. Sentieys, Steven Derrien\",\"doi\":\"10.1145/2228360.2228371\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Wakeup time is an important overhead that must be determined for effective power gating, particularly in logic clusters that undergo frequent mode transitions for run-time leakage power reduction. In this paper, a semiempirical model for virtual supply voltage in terms of basic parameters of the power-gated circuit is presented. Hence a closed-form expression for estimation of wakeup time of a power-gated logic cluster is derived. Experimental results of application of the model to ISCAS85 benchmark circuits show that wakeup time may be estimated within an average error of 16.3% across 22× variation in sleep transistor sizes and 13× variation in circuit sizes with significant speedup in computation time compared to SPICE level circuit simulations.\",\"PeriodicalId\":263599,\"journal\":{\"name\":\"DAC Design Automation Conference 2012\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"DAC Design Automation Conference 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2228360.2228371\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"DAC Design Automation Conference 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2228360.2228371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A semiempirical model for wakeup time estimation in power-gated logic clusters
Wakeup time is an important overhead that must be determined for effective power gating, particularly in logic clusters that undergo frequent mode transitions for run-time leakage power reduction. In this paper, a semiempirical model for virtual supply voltage in terms of basic parameters of the power-gated circuit is presented. Hence a closed-form expression for estimation of wakeup time of a power-gated logic cluster is derived. Experimental results of application of the model to ISCAS85 benchmark circuits show that wakeup time may be estimated within an average error of 16.3% across 22× variation in sleep transistor sizes and 13× variation in circuit sizes with significant speedup in computation time compared to SPICE level circuit simulations.