{"title":"一种采用谐振电感耦合的TSV测试探头","authors":"Rashid Rahsidzadeh, Iftekhar Basitih","doi":"10.1109/itc.2013.6917153","DOIUrl":null,"url":null,"abstract":"A contactless TSV probe based on the principle of resonant inductive coupling is presented in this work. The proposed scheme allows TSV data observation up to 2Gbps when the pobe and TSV are 15μm apart.","PeriodicalId":252757,"journal":{"name":"Proceedings of the 2013 25th International Teletraffic Congress (ITC)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A test probe for TSV using resonant inductive coupling\",\"authors\":\"Rashid Rahsidzadeh, Iftekhar Basitih\",\"doi\":\"10.1109/itc.2013.6917153\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A contactless TSV probe based on the principle of resonant inductive coupling is presented in this work. The proposed scheme allows TSV data observation up to 2Gbps when the pobe and TSV are 15μm apart.\",\"PeriodicalId\":252757,\"journal\":{\"name\":\"Proceedings of the 2013 25th International Teletraffic Congress (ITC)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2013 25th International Teletraffic Congress (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/itc.2013.6917153\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2013 25th International Teletraffic Congress (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/itc.2013.6917153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A test probe for TSV using resonant inductive coupling
A contactless TSV probe based on the principle of resonant inductive coupling is presented in this work. The proposed scheme allows TSV data observation up to 2Gbps when the pobe and TSV are 15μm apart.