45纳米栅极长度CMOS技术及以上采用陡光晕

H. Wakabayashi, M. Ueki, M. Narihiro, T. Fukai, N. Ikezawa, T. Matsuda, K. Yoshida, K. Takeuchi, Y. Ochiai, T. Mogami, T. Kunio
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引用次数: 39

摘要

采用高陡坡速率尖峰退火(HRR-SA)的45纳米陡光晕CMOS器件在1.2 V下的关闭电流小于10 nA//spl mu/m,驱动电流分别为697和292 /spl mu/ a //spl mu/m。当关闭电流小于300 nA//spl mu/m时,33 nm pmosfet在1.2 V时具有403 /spl mu/ a //spl mu/m的高驱动电流。为了制造比这些mosfet更陡峭的光晕,在深源/漏极(S/D)形成后,使用HRR-SA工艺进行源/漏极扩展(SDE)激活。通过使用这个定义为反阶S/D形成的序列,在1.2 V下,在小于300 nA//spl mu/m的关闭电流下,实现了796 /spl mu/ a //spl mu/m的高驱动电流的24nm nmosfet。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
45-nm gate length CMOS technology and beyond using steep halo
45-nm CMOS devices with a steep halo using a high-ramp-rate spike annealing (HRR-SA) are demonstrated with drive currents of 697 and 292 /spl mu/A//spl mu/m for an off current less than 10 nA//spl mu/m at 1.2 V. For an off current less than 300 nA//spl mu/m, 33-nm pMOSFETs have a high drive current of 403 /spl mu/A//spl mu/m at 1.2 V. In order to fabricate a steeper halo than these MOSFETs, a source/drain extension (SDE) activation using the HRR-SA process was performed after a deep source/drain (S/D) formation. By using this sequence defined as a reverse-order S/D formation, 24-nm nMOSFETs are achieved with a high drive current of 796 /spl mu/A//spl mu/m for an off current less than 300 nA//spl mu/m at 1.2 V.
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