Stephen J. Sweeney, Leslie Jamieson Lyons, Alfred R Adams, Daren Alfred Lock
{"title":"高功率980nm半导体二极管激光器表面温度及熔点和COD的直接测量","authors":"Stephen J. Sweeney, Leslie Jamieson Lyons, Alfred R Adams, Daren Alfred Lock","doi":"10.1109/ISLC.2002.1041166","DOIUrl":null,"url":null,"abstract":"We measure the high-energy emission from high power lasers and extract the facet temperature. Severe heating is observed up to the onset of catastrophic optical damage (COD).","PeriodicalId":179103,"journal":{"name":"IEEE 18th International Semiconductor Laser Conference","volume":"482 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Direct measurement of facet temperature up to the melting point and COD in high power 980nm semiconductor diode lasers\",\"authors\":\"Stephen J. Sweeney, Leslie Jamieson Lyons, Alfred R Adams, Daren Alfred Lock\",\"doi\":\"10.1109/ISLC.2002.1041166\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We measure the high-energy emission from high power lasers and extract the facet temperature. Severe heating is observed up to the onset of catastrophic optical damage (COD).\",\"PeriodicalId\":179103,\"journal\":{\"name\":\"IEEE 18th International Semiconductor Laser Conference\",\"volume\":\"482 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 18th International Semiconductor Laser Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISLC.2002.1041166\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 18th International Semiconductor Laser Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.2002.1041166","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Direct measurement of facet temperature up to the melting point and COD in high power 980nm semiconductor diode lasers
We measure the high-energy emission from high power lasers and extract the facet temperature. Severe heating is observed up to the onset of catastrophic optical damage (COD).
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