基于pmos开关的电荷泵,允许在CMOS标准工艺上实现成本损失

E. Racape, J. Daga
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引用次数: 23

摘要

基于低压PMOS开关电路的4相电荷泵已在0.18/spl mu/m CMOS标准工艺中实现,无需任何额外的掩模和工艺步骤。低压PMOS开关的使用克服了高压NMOS器件固有的局限性,如:驱动性能差、寄生电容大、阈值电压对体偏置和温度的敏感性。使用所提出的电路,在1.2v供电的11级实现上测量了高达14v的输出电压,仅在容性负载下,每级平均增益为97%。此外,在扩展的Vdd范围内,对于不同的电流负载,测量到几乎与温度无关的效率为53%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A PMOS-switch based charge pump, allowing lost cost implementation on a CMOS standard process
A 4-phase charge pump based on the low-voltage PMOS switching circuitry has been implemented in a 0.18/spl mu/m CMOS standard process, without any additional masking and process steps. The use of low-voltage PMOS switches overcomes the intrinsic limitations of high voltage NMOS devices such as: poor drive, large parasitic capacitance, threshold voltage sensitivity to body bias and temperature. Using the proposed circuitry, up to 14v output voltage has been measured on a 11-stage implementation powered at 1.2v, resulting in 97% of Vdd average gain per stage with capacitive loading only. In addition, nearly temperature independent efficiency of 53% has been measured on an extended Vdd range, for different current loads.
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