{"title":"基于pmos开关的电荷泵,允许在CMOS标准工艺上实现成本损失","authors":"E. Racape, J. Daga","doi":"10.1109/ESSCIR.2005.1541562","DOIUrl":null,"url":null,"abstract":"A 4-phase charge pump based on the low-voltage PMOS switching circuitry has been implemented in a 0.18/spl mu/m CMOS standard process, without any additional masking and process steps. The use of low-voltage PMOS switches overcomes the intrinsic limitations of high voltage NMOS devices such as: poor drive, large parasitic capacitance, threshold voltage sensitivity to body bias and temperature. Using the proposed circuitry, up to 14v output voltage has been measured on a 11-stage implementation powered at 1.2v, resulting in 97% of Vdd average gain per stage with capacitive loading only. In addition, nearly temperature independent efficiency of 53% has been measured on an extended Vdd range, for different current loads.","PeriodicalId":239980,"journal":{"name":"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":"{\"title\":\"A PMOS-switch based charge pump, allowing lost cost implementation on a CMOS standard process\",\"authors\":\"E. Racape, J. Daga\",\"doi\":\"10.1109/ESSCIR.2005.1541562\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 4-phase charge pump based on the low-voltage PMOS switching circuitry has been implemented in a 0.18/spl mu/m CMOS standard process, without any additional masking and process steps. The use of low-voltage PMOS switches overcomes the intrinsic limitations of high voltage NMOS devices such as: poor drive, large parasitic capacitance, threshold voltage sensitivity to body bias and temperature. Using the proposed circuitry, up to 14v output voltage has been measured on a 11-stage implementation powered at 1.2v, resulting in 97% of Vdd average gain per stage with capacitive loading only. In addition, nearly temperature independent efficiency of 53% has been measured on an extended Vdd range, for different current loads.\",\"PeriodicalId\":239980,\"journal\":{\"name\":\"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIR.2005.1541562\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIR.2005.1541562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A PMOS-switch based charge pump, allowing lost cost implementation on a CMOS standard process
A 4-phase charge pump based on the low-voltage PMOS switching circuitry has been implemented in a 0.18/spl mu/m CMOS standard process, without any additional masking and process steps. The use of low-voltage PMOS switches overcomes the intrinsic limitations of high voltage NMOS devices such as: poor drive, large parasitic capacitance, threshold voltage sensitivity to body bias and temperature. Using the proposed circuitry, up to 14v output voltage has been measured on a 11-stage implementation powered at 1.2v, resulting in 97% of Vdd average gain per stage with capacitive loading only. In addition, nearly temperature independent efficiency of 53% has been measured on an extended Vdd range, for different current loads.