{"title":"热现象对IGBT动态参数影响的研究","authors":"P. Górecki","doi":"10.23919/MIXDES.2018.8436757","DOIUrl":null,"url":null,"abstract":"The paper concerns the study on an influence of thermal phenomena on dynamic parameters of the IGBT. The used measurement set-up and the results of measurements of waveforms of the selected transistor obtained under different operating conditions are presented. The influence of the ambient temperature and the self-heating phenomenon on the shape of these waveforms is discussed.","PeriodicalId":349007,"journal":{"name":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Investigation of the Influence of Thermal Phenomena on Dynamic Parameters of the IGBT\",\"authors\":\"P. Górecki\",\"doi\":\"10.23919/MIXDES.2018.8436757\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper concerns the study on an influence of thermal phenomena on dynamic parameters of the IGBT. The used measurement set-up and the results of measurements of waveforms of the selected transistor obtained under different operating conditions are presented. The influence of the ambient temperature and the self-heating phenomenon on the shape of these waveforms is discussed.\",\"PeriodicalId\":349007,\"journal\":{\"name\":\"2018 25th International Conference \\\"Mixed Design of Integrated Circuits and System\\\" (MIXDES)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 25th International Conference \\\"Mixed Design of Integrated Circuits and System\\\" (MIXDES)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MIXDES.2018.8436757\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 25th International Conference \"Mixed Design of Integrated Circuits and System\" (MIXDES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIXDES.2018.8436757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of the Influence of Thermal Phenomena on Dynamic Parameters of the IGBT
The paper concerns the study on an influence of thermal phenomena on dynamic parameters of the IGBT. The used measurement set-up and the results of measurements of waveforms of the selected transistor obtained under different operating conditions are presented. The influence of the ambient temperature and the self-heating phenomenon on the shape of these waveforms is discussed.