LDMOS器件的电热Smoothie数据库模型

Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Pub Date : 2004-11-15 DOI:10.1109/ESSDER.2004.1356590

V. Cuoco, W. Neo, M. Spirito, O. Yanson, N. Nenadovic, L. D. de Vreede, H. Jos, J. Burghartz

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引用次数: 8

摘要

在本文中，我们提出了用于LDMOS器件的Smoothie数据库模型的电热(ET)扩展并进行了实验验证。为了验证直流电流，在连续模式和不同温度下的等温条件下测量了漏极电流。在RF大信号验证中，我们使用了LDMOS器件的真实负载条件，同时提供了双音和IS-95 CDMA测试条件。在此基础上，通过监测器件线性度与音调间距的关系，研究了热记忆效应。在所有的实验中，Smoothie都与测量结果非常吻合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The electro-thermal Smoothie database model for LDMOS devices

In this paper, we present the electro-thermal (ET) extension of the Smoothie database model for LDMOS devices together with its experimental verification. For the DC verification, the drain current was measured both in continuous mode and under isothermal conditions at different temperatures. In the RF large-signal verification, we used realistic loading conditions for the LDMOS devices while providing two-tone as well as IS-95 CDMA test conditions. With the aid of the above, thermal memory effects were studied by monitoring the device linearity versus tone spacing. In all the experiments, Smoothie demonstrated an excellent agreement with the measured results.

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Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)

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