{"title":"使用完成检测恢复吞吐量的错误弹性,近阈值逻辑","authors":"Joseph Crop, R. Pawlowski, P. Chiang","doi":"10.1145/2228360.2228535","DOIUrl":null,"url":null,"abstract":"Operating in the near-threshold regime can result in significant energy savings. Unfortunately, the increased timing variation prevents conventional error-detection techniques from properly functioning. This paper introduces two circuit-level timing error detection techniques that aim to increase throughput while operating in the near-threshold voltage regime: current-sensing completion detection and transition-aware completion detection. Each method allows any digital circuit to operate at speeds not limited by the worst-case critical path. Throughput improvements and energy savings are reported for implementations on a 16-bit adder.","PeriodicalId":263599,"journal":{"name":"DAC Design Automation Conference 2012","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Regaining throughput using completion detection for error-resilient, near-threshold logic\",\"authors\":\"Joseph Crop, R. Pawlowski, P. Chiang\",\"doi\":\"10.1145/2228360.2228535\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Operating in the near-threshold regime can result in significant energy savings. Unfortunately, the increased timing variation prevents conventional error-detection techniques from properly functioning. This paper introduces two circuit-level timing error detection techniques that aim to increase throughput while operating in the near-threshold voltage regime: current-sensing completion detection and transition-aware completion detection. Each method allows any digital circuit to operate at speeds not limited by the worst-case critical path. Throughput improvements and energy savings are reported for implementations on a 16-bit adder.\",\"PeriodicalId\":263599,\"journal\":{\"name\":\"DAC Design Automation Conference 2012\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"DAC Design Automation Conference 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2228360.2228535\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"DAC Design Automation Conference 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2228360.2228535","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Regaining throughput using completion detection for error-resilient, near-threshold logic
Operating in the near-threshold regime can result in significant energy savings. Unfortunately, the increased timing variation prevents conventional error-detection techniques from properly functioning. This paper introduces two circuit-level timing error detection techniques that aim to increase throughput while operating in the near-threshold voltage regime: current-sensing completion detection and transition-aware completion detection. Each method allows any digital circuit to operate at speeds not limited by the worst-case critical path. Throughput improvements and energy savings are reported for implementations on a 16-bit adder.