{"title":"统一形状检查器-一个检查工具的LSI","authors":"C. McCaw","doi":"10.1109/DAC.1979.1600092","DOIUrl":null,"url":null,"abstract":"The designing and manufacturing techniques for integrated circuits have spawned a new free-form checking tool in IBM. This software tool has met the requirements of low cost for large volumes of data, breadth of function to support numerous methodologies, and depth of function for any specific technology.","PeriodicalId":345241,"journal":{"name":"16th Design Automation Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"Unified Shapes Checker - A Checking Tool for LSI\",\"authors\":\"C. McCaw\",\"doi\":\"10.1109/DAC.1979.1600092\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The designing and manufacturing techniques for integrated circuits have spawned a new free-form checking tool in IBM. This software tool has met the requirements of low cost for large volumes of data, breadth of function to support numerous methodologies, and depth of function for any specific technology.\",\"PeriodicalId\":345241,\"journal\":{\"name\":\"16th Design Automation Conference\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1979.1600092\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1979.1600092","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The designing and manufacturing techniques for integrated circuits have spawned a new free-form checking tool in IBM. This software tool has met the requirements of low cost for large volumes of data, breadth of function to support numerous methodologies, and depth of function for any specific technology.
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