{"title":"积极减少内存块的泄漏","authors":"D. El-Dib, H. Shawkey, Z. Abid","doi":"10.1109/ICM.2010.5696204","DOIUrl":null,"url":null,"abstract":"Excessive leakage of cache blocks encourages forcing the cache block into low-leakage state all the time except during read/write operations. By retaining the values of the cache cells during low leakage state, the penalty for re-activating the sleepy cache cells is also reduced. This is achieved using aggressive policies with simple control strategies using one of two methods. Either by adding a low voltage supply, operating the cache at low voltage all the time and enabling normal voltage only during a read/write operation to the cache line or by adding a ground gating NMOS transistor, which cuts the path from the supply voltage to ground all the time except during a read/write operation to the cache line. Both methods succeed to reduce leakage power during idle state by around 90% using minimum hardware control overhead, but suffer from process variation vulnerability and lower SNM.","PeriodicalId":215859,"journal":{"name":"2010 International Conference on Microelectronics","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reducing the leakage of memory blocks aggressively\",\"authors\":\"D. El-Dib, H. Shawkey, Z. Abid\",\"doi\":\"10.1109/ICM.2010.5696204\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Excessive leakage of cache blocks encourages forcing the cache block into low-leakage state all the time except during read/write operations. By retaining the values of the cache cells during low leakage state, the penalty for re-activating the sleepy cache cells is also reduced. This is achieved using aggressive policies with simple control strategies using one of two methods. Either by adding a low voltage supply, operating the cache at low voltage all the time and enabling normal voltage only during a read/write operation to the cache line or by adding a ground gating NMOS transistor, which cuts the path from the supply voltage to ground all the time except during a read/write operation to the cache line. Both methods succeed to reduce leakage power during idle state by around 90% using minimum hardware control overhead, but suffer from process variation vulnerability and lower SNM.\",\"PeriodicalId\":215859,\"journal\":{\"name\":\"2010 International Conference on Microelectronics\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on Microelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2010.5696204\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Microelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2010.5696204","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reducing the leakage of memory blocks aggressively
Excessive leakage of cache blocks encourages forcing the cache block into low-leakage state all the time except during read/write operations. By retaining the values of the cache cells during low leakage state, the penalty for re-activating the sleepy cache cells is also reduced. This is achieved using aggressive policies with simple control strategies using one of two methods. Either by adding a low voltage supply, operating the cache at low voltage all the time and enabling normal voltage only during a read/write operation to the cache line or by adding a ground gating NMOS transistor, which cuts the path from the supply voltage to ground all the time except during a read/write operation to the cache line. Both methods succeed to reduce leakage power during idle state by around 90% using minimum hardware control overhead, but suffer from process variation vulnerability and lower SNM.