积极减少内存块的泄漏

D. El-Dib, H. Shawkey, Z. Abid
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引用次数: 0

摘要

缓存块的过度泄漏会迫使缓存块一直进入低泄漏状态,除了读/写操作期间。通过在低泄漏状态下保留缓存单元的值,重新激活休眠缓存单元的代价也降低了。这可以通过使用两种方法之一的积极策略和简单的控制策略来实现。通过增加一个低压电源,使缓存始终在低电压下工作,只有在对缓存线进行读/写操作时才使能正常电压,或者通过增加一个接地门控NMOS晶体管,除对缓存线进行读/写操作外,它一直切断从电源电压到地的路径。这两种方法都能以最小的硬件控制开销将空闲状态下的泄漏功率降低90%左右,但存在工艺变化漏洞和较低的SNM。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reducing the leakage of memory blocks aggressively
Excessive leakage of cache blocks encourages forcing the cache block into low-leakage state all the time except during read/write operations. By retaining the values of the cache cells during low leakage state, the penalty for re-activating the sleepy cache cells is also reduced. This is achieved using aggressive policies with simple control strategies using one of two methods. Either by adding a low voltage supply, operating the cache at low voltage all the time and enabling normal voltage only during a read/write operation to the cache line or by adding a ground gating NMOS transistor, which cuts the path from the supply voltage to ground all the time except during a read/write operation to the cache line. Both methods succeed to reduce leakage power during idle state by around 90% using minimum hardware control overhead, but suffer from process variation vulnerability and lower SNM.
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