{"title":"用于深紫外应用的简单且具有成本效益的TFA掺杂In2O3光电探测器","authors":"Prachi Gupta, S. Sharma","doi":"10.1109/EDTM55494.2023.10102980","DOIUrl":null,"url":null,"abstract":"Deep ultraviolet (DUV) photodetectors have critical applications in artificial intelligence, communications, missile detection, wearable technology, lithography aligners etc. However, commercially available DUV optoelectronic devices still possess low selectivity and stability. Here, we report facile, cost-effective metal-semiconductor-metal (MSM) (Al-In<inf>2</inf>O<inf>3</inf>-Al), DUV (<tex>$\\lambda \\sim 254$</tex> nm) photodetectors, by solution processed In<inf>2</inf>O<inf>3</inf> and photoactive tri-flouro acetic acid (TFA) additive In<inf>2</inf>O<inf>3</inf> thin films. The fabricated photodetector device structures exhibit the higher responsivity (2.79 A/W), external quantum efficiency (1362%), and higher detectivity <tex>$(\\sim 1.64\\ \\mathrm{x}\\ 10^{11}\\ \\text{cm}\\ \\text{ Hz }^{1/2}\\mathrm{W}^{-1})$</tex>. Tfa based In<inf>2</inf>O<inf>3</inf> photodetectors exhibit low cost, scalability, with maximum photocurrent <tex>$(\\sim 15.5\\ \\mathrm{x}\\ 10^{-6}\\ \\mathrm{A})$</tex>. This work demonstrates the effects of doping photoactive additives in In<inf>2</inf>O<inf>3</inf> for the highly efficient, stable, and highly selective DUV detection applications.","PeriodicalId":418413,"journal":{"name":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Facile and Cost-Effective TFA doped In2O3 photodetectors for Deep Ultra Violet Applications\",\"authors\":\"Prachi Gupta, S. Sharma\",\"doi\":\"10.1109/EDTM55494.2023.10102980\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Deep ultraviolet (DUV) photodetectors have critical applications in artificial intelligence, communications, missile detection, wearable technology, lithography aligners etc. However, commercially available DUV optoelectronic devices still possess low selectivity and stability. Here, we report facile, cost-effective metal-semiconductor-metal (MSM) (Al-In<inf>2</inf>O<inf>3</inf>-Al), DUV (<tex>$\\\\lambda \\\\sim 254$</tex> nm) photodetectors, by solution processed In<inf>2</inf>O<inf>3</inf> and photoactive tri-flouro acetic acid (TFA) additive In<inf>2</inf>O<inf>3</inf> thin films. The fabricated photodetector device structures exhibit the higher responsivity (2.79 A/W), external quantum efficiency (1362%), and higher detectivity <tex>$(\\\\sim 1.64\\\\ \\\\mathrm{x}\\\\ 10^{11}\\\\ \\\\text{cm}\\\\ \\\\text{ Hz }^{1/2}\\\\mathrm{W}^{-1})$</tex>. Tfa based In<inf>2</inf>O<inf>3</inf> photodetectors exhibit low cost, scalability, with maximum photocurrent <tex>$(\\\\sim 15.5\\\\ \\\\mathrm{x}\\\\ 10^{-6}\\\\ \\\\mathrm{A})$</tex>. This work demonstrates the effects of doping photoactive additives in In<inf>2</inf>O<inf>3</inf> for the highly efficient, stable, and highly selective DUV detection applications.\",\"PeriodicalId\":418413,\"journal\":{\"name\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTM55494.2023.10102980\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM55494.2023.10102980","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
深紫外(DUV)光电探测器在人工智能、通信、导弹探测、可穿戴技术、光刻对准仪等领域有着重要的应用。然而,商用DUV光电器件仍然具有低选择性和稳定性。在这里,我们报告了简单的,具有成本效益的金属-半导体-金属(MSM) (Al-In2O3-Al), DUV ($\lambda \sim 254$ nm)光电探测器,通过溶液处理的In2O3和光活性三氟乙酸(TFA)添加剂In2O3薄膜。所制备的光电探测器器件结构具有较高的响应率(2.79 A/W),外量子效率(1362%), and higher detectivity $(\sim 1.64\ \mathrm{x}\ 10^{11}\ \text{cm}\ \text{ Hz }^{1/2}\mathrm{W}^{-1})$. Tfa based In2O3 photodetectors exhibit low cost, scalability, with maximum photocurrent $(\sim 15.5\ \mathrm{x}\ 10^{-6}\ \mathrm{A})$. This work demonstrates the effects of doping photoactive additives in In2O3 for the highly efficient, stable, and highly selective DUV detection applications.
Facile and Cost-Effective TFA doped In2O3 photodetectors for Deep Ultra Violet Applications
Deep ultraviolet (DUV) photodetectors have critical applications in artificial intelligence, communications, missile detection, wearable technology, lithography aligners etc. However, commercially available DUV optoelectronic devices still possess low selectivity and stability. Here, we report facile, cost-effective metal-semiconductor-metal (MSM) (Al-In2O3-Al), DUV ($\lambda \sim 254$ nm) photodetectors, by solution processed In2O3 and photoactive tri-flouro acetic acid (TFA) additive In2O3 thin films. The fabricated photodetector device structures exhibit the higher responsivity (2.79 A/W), external quantum efficiency (1362%), and higher detectivity $(\sim 1.64\ \mathrm{x}\ 10^{11}\ \text{cm}\ \text{ Hz }^{1/2}\mathrm{W}^{-1})$. Tfa based In2O3 photodetectors exhibit low cost, scalability, with maximum photocurrent $(\sim 15.5\ \mathrm{x}\ 10^{-6}\ \mathrm{A})$. This work demonstrates the effects of doping photoactive additives in In2O3 for the highly efficient, stable, and highly selective DUV detection applications.