使用布尔可满足性的并行测试模式生成

[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design Pub Date : 1991-01-04 DOI:10.1109/ISVD.1991.185095

V. Sivaramakrishnan, S. Seth, P. Agrawal

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引用次数: 9

摘要

最近，Larrabee提出了一种基于布尔可满足性的组合电路序列测试生成算法，并在基准电路上给出了支持该方法可行性的结果。考虑到问题的已知难度(np完备性)，测试生成算法的并行实现很有吸引力。本文提出了Larrabee算法的并行版本，适合在共享内存和消息传递的多计算机上实现

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Parallel test pattern generation using Boolean satisfiability

Recently, Larrabee proposed a sequential test generation algorithm for combinational circuits based on Boolean satisfiability and presented results on benchmark circuits in support of the viability of this approach. Parallel implementations of test generation algorithms are attractive in view of the known difficulty (NP-completeness) of the problem. This paper suggests parallel versions of Larrabee's algorithm, suitable for implementation on shared-memory and message-passing multicomputers.<>

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[1991] Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design

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