高速无透镜集成接近传感器

1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1997-10-08 DOI:10.1109/ICISS.1997.630253

G. Chapman, D. E. Bergen

{"title":"高速无透镜集成接近传感器","authors":"G. Chapman, D. E. Bergen","doi":"10.1109/ICISS.1997.630253","DOIUrl":null,"url":null,"abstract":"An integrated sensor array has been developed using lensless techniques that produces a high accuracy proximity measurement from contact to 18 mm. An integrated optical detector and processing circuitry chip was developed for this application. It locates the brightest spot within an optical array which will output the proximity position every 5.3 /spl mu/s.","PeriodicalId":357602,"journal":{"name":"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High speed lensless integrated proximity sensor\",\"authors\":\"G. Chapman, D. E. Bergen\",\"doi\":\"10.1109/ICISS.1997.630253\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated sensor array has been developed using lensless techniques that produces a high accuracy proximity measurement from contact to 18 mm. An integrated optical detector and processing circuitry chip was developed for this application. It locates the brightest spot within an optical array which will output the proximity position every 5.3 /spl mu/s.\",\"PeriodicalId\":357602,\"journal\":{\"name\":\"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICISS.1997.630253\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICISS.1997.630253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

使用无透镜技术开发了一种集成传感器阵列，可以产生从接触到18毫米的高精度接近测量。为此开发了一种集成光检测器和处理电路芯片。它在光学阵列中定位最亮的点，光学阵列将每5.3 /spl mu/s输出接近位置。

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High speed lensless integrated proximity sensor

An integrated sensor array has been developed using lensless techniques that produces a high accuracy proximity measurement from contact to 18 mm. An integrated optical detector and processing circuitry chip was developed for this application. It locates the brightest spot within an optical array which will output the proximity position every 5.3 /spl mu/s.

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来源期刊

1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon

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