{"title":"TFET反向电流对电路运作的影响:个案研究","authors":"J. Núñez","doi":"10.1109/ULIS.2018.8354753","DOIUrl":null,"url":null,"abstract":"Tunnel FET transistors (TFETs) are one of the most promising candidates to replace CMOS transistors for future integrated circuits. However TFET-based circuit design can exhibit significant limitations due to their reverse conduction currents caused by the direct bias of the intrinsic diode of these transistors. In this paper we analyze in depth this issue through the design of charge pump (DC-DC step up converters) circuits for energy harvesting applications. The proposed solution mitigates the impact of reverse conduction currents and, thus, improves power conversion efficiencies (PCE) compared to previous designs.","PeriodicalId":383788,"journal":{"name":"2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of TFET reverse currents into circuit operation: A case study\",\"authors\":\"J. Núñez\",\"doi\":\"10.1109/ULIS.2018.8354753\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Tunnel FET transistors (TFETs) are one of the most promising candidates to replace CMOS transistors for future integrated circuits. However TFET-based circuit design can exhibit significant limitations due to their reverse conduction currents caused by the direct bias of the intrinsic diode of these transistors. In this paper we analyze in depth this issue through the design of charge pump (DC-DC step up converters) circuits for energy harvesting applications. The proposed solution mitigates the impact of reverse conduction currents and, thus, improves power conversion efficiencies (PCE) compared to previous designs.\",\"PeriodicalId\":383788,\"journal\":{\"name\":\"2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-03-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULIS.2018.8354753\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULIS.2018.8354753","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of TFET reverse currents into circuit operation: A case study
Tunnel FET transistors (TFETs) are one of the most promising candidates to replace CMOS transistors for future integrated circuits. However TFET-based circuit design can exhibit significant limitations due to their reverse conduction currents caused by the direct bias of the intrinsic diode of these transistors. In this paper we analyze in depth this issue through the design of charge pump (DC-DC step up converters) circuits for energy harvesting applications. The proposed solution mitigates the impact of reverse conduction currents and, thus, improves power conversion efficiencies (PCE) compared to previous designs.