{"title":"高级MOSFET建模-第2节","authors":"C. McAndrew","doi":"10.1109/cicc.2004.1358716","DOIUrl":null,"url":null,"abstract":"RF and mixed-signal design depends on the availability of accurate and realistic device models. The relentless advance in speed and performance of CMOS technologies has opened up new product areas for CMOS, such as RF, but the most widely used MOSFET models have not kept pace with this advance. This session contains four papers that report developments in areas of MOSFET modeling that are critical for modern technologies and application areas.","PeriodicalId":407909,"journal":{"name":"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Advanced MOSFET modeling - Session 2\",\"authors\":\"C. McAndrew\",\"doi\":\"10.1109/cicc.2004.1358716\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"RF and mixed-signal design depends on the availability of accurate and realistic device models. The relentless advance in speed and performance of CMOS technologies has opened up new product areas for CMOS, such as RF, but the most widely used MOSFET models have not kept pace with this advance. This session contains four papers that report developments in areas of MOSFET modeling that are critical for modern technologies and application areas.\",\"PeriodicalId\":407909,\"journal\":{\"name\":\"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/cicc.2004.1358716\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/cicc.2004.1358716","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF and mixed-signal design depends on the availability of accurate and realistic device models. The relentless advance in speed and performance of CMOS technologies has opened up new product areas for CMOS, such as RF, but the most widely used MOSFET models have not kept pace with this advance. This session contains four papers that report developments in areas of MOSFET modeling that are critical for modern technologies and application areas.