一种遥控自动测量系统

F. Alegria, H. G. Ramos
{"title":"一种遥控自动测量系统","authors":"F. Alegria, H. G. Ramos","doi":"10.1109/IMTC.1997.612387","DOIUrl":null,"url":null,"abstract":"Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"A remote controlled automated measurement system\",\"authors\":\"F. Alegria, H. G. Ramos\",\"doi\":\"10.1109/IMTC.1997.612387\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus.\",\"PeriodicalId\":124893,\"journal\":{\"name\":\"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1997.612387\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1997.612387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

如今,无论是在工业领域还是在研发中心,通过网络PC对仪表系统进行控制都变得越来越重要。本文介绍了一种用于表征半导体器件的自动测量系统。该系统可以由任何集成在局域网中的PC机使用客户端/服务器通信进行控制。服务器通过IEEE-488接口总线控制仪表。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A remote controlled automated measurement system
Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus.
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