{"title":"一种遥控自动测量系统","authors":"F. Alegria, H. G. Ramos","doi":"10.1109/IMTC.1997.612387","DOIUrl":null,"url":null,"abstract":"Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"A remote controlled automated measurement system\",\"authors\":\"F. Alegria, H. G. Ramos\",\"doi\":\"10.1109/IMTC.1997.612387\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus.\",\"PeriodicalId\":124893,\"journal\":{\"name\":\"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1997.612387\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1997.612387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus.