采用22纳米FD-SOI工艺实现的高线性4位闪存ADC

Z. Jaworski
{"title":"采用22纳米FD-SOI工艺实现的高线性4位闪存ADC","authors":"Z. Jaworski","doi":"10.23919/MIXDES.2019.8787023","DOIUrl":null,"url":null,"abstract":"This paper presents the design of 4-bit flash type analog-to-digital converter implemented in 22 nm FD-SOI technology with 0.8 V supply voltage. This block is part of original sub-ranging ADC whose working principle is based on the assumption that sub-ADC and sub-DAC exhibit high linearity while they nominal resolutions remain relatively low. The linearity of the presented flash ADC has to be as high as in case of 8-bit converter. Thus, the most challenging task was to design comparator with resolution of ±1.5 mV. This goal was reached owing to ability offered by the FD-SOI process to trim transistor’s threshold voltage by means of modulating the back-gate polarization. The resulting sampling rate is 500 Ms/s.","PeriodicalId":309822,"journal":{"name":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Highly Linear 4-bit Flash ADC Implemented in 22 nm FD-SOI Process\",\"authors\":\"Z. Jaworski\",\"doi\":\"10.23919/MIXDES.2019.8787023\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the design of 4-bit flash type analog-to-digital converter implemented in 22 nm FD-SOI technology with 0.8 V supply voltage. This block is part of original sub-ranging ADC whose working principle is based on the assumption that sub-ADC and sub-DAC exhibit high linearity while they nominal resolutions remain relatively low. The linearity of the presented flash ADC has to be as high as in case of 8-bit converter. Thus, the most challenging task was to design comparator with resolution of ±1.5 mV. This goal was reached owing to ability offered by the FD-SOI process to trim transistor’s threshold voltage by means of modulating the back-gate polarization. The resulting sampling rate is 500 Ms/s.\",\"PeriodicalId\":309822,\"journal\":{\"name\":\"2019 MIXDES - 26th International Conference \\\"Mixed Design of Integrated Circuits and Systems\\\"\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 MIXDES - 26th International Conference \\\"Mixed Design of Integrated Circuits and Systems\\\"\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MIXDES.2019.8787023\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 MIXDES - 26th International Conference \"Mixed Design of Integrated Circuits and Systems\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MIXDES.2019.8787023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文设计了一种采用22 nm FD-SOI技术实现的4位闪存型模数转换器,电源电压为0.8 V。该模块是原始子量程ADC的一部分,其工作原理基于子ADC和子dac具有高线性度的假设,而它们的标称分辨率仍然相对较低。所提出的闪存ADC的线性度必须与8位转换器一样高。因此,最具挑战性的任务是设计分辨率为±1.5 mV的比较器。这一目标的实现是由于FD-SOI工艺提供了通过调制后门极化来调节晶体管阈值电压的能力。得到的采样率为500ms /s。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Highly Linear 4-bit Flash ADC Implemented in 22 nm FD-SOI Process
This paper presents the design of 4-bit flash type analog-to-digital converter implemented in 22 nm FD-SOI technology with 0.8 V supply voltage. This block is part of original sub-ranging ADC whose working principle is based on the assumption that sub-ADC and sub-DAC exhibit high linearity while they nominal resolutions remain relatively low. The linearity of the presented flash ADC has to be as high as in case of 8-bit converter. Thus, the most challenging task was to design comparator with resolution of ±1.5 mV. This goal was reached owing to ability offered by the FD-SOI process to trim transistor’s threshold voltage by means of modulating the back-gate polarization. The resulting sampling rate is 500 Ms/s.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信