一种利用高层次设计信息的不敏感路径识别方法

S. Ohtake, Naotsugu Ikeda, M. Inoue, H. Fujiwara
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引用次数: 5

摘要

提出了一种不敏感路径识别方法。该方法通过处理时序电路中寄存器-传输级(RTL)的不可测路径,并利用高级综合得到的设计信息,有效地识别出时序不敏感路径。识别出的不敏感路径信息不仅可以简化测试生成过程,而且可以减少测试的无效性。在这项工作中,我们采用非鲁棒不敏性,这在当前的ATPG系统中得到广泛支持,用于识别不敏性路径。我们通过使用从行为基准电路合成的RTL电路的实验,证明了使用高级设计信息的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A method of unsensitizable path identification using high level design information
This paper proposes a method of unsensitizable path identification. By dealing with untestable paths in sequential circuits at register-transfer level (RTL) and utilizing design information obtained from high-level synthesis, the method can identify sequentially unsensitizable paths effectively and efficiently. Information about identified unsensitizable paths can not only facilitate process of test generation but also mitigate futileness of testing. In this work, we employ non-robust unsensitizability, which is widely supported in current ATPG systems, for identifying unsensitizable paths. We show the effectiveness of use of high-level design information through our experiments using RTL circuits synthesized from behavioral benchmark circuits.
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