{"title":"使用WiNo*系列实现连接事物的快速原型","authors":"A. Bossche, R. Dalcé, T. Val","doi":"10.1002/9781119549765.ch4","DOIUrl":null,"url":null,"abstract":"In order to be able to deploy the various solutions for the Device Layer of the Internet of Things, these proposals must be evaluated in terms of performance, scalability and repeatability. This paper introduces our test platform which was designed to be able to support these types of tests. We describe the wireless nodes which make up the test platform and present a selection of use cases.","PeriodicalId":218080,"journal":{"name":"Challenges of the Internet of Things","volume":"216 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Enabling Fast-prototyping of Connected Things using the WiNo*Family\",\"authors\":\"A. Bossche, R. Dalcé, T. Val\",\"doi\":\"10.1002/9781119549765.ch4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order to be able to deploy the various solutions for the Device Layer of the Internet of Things, these proposals must be evaluated in terms of performance, scalability and repeatability. This paper introduces our test platform which was designed to be able to support these types of tests. We describe the wireless nodes which make up the test platform and present a selection of use cases.\",\"PeriodicalId\":218080,\"journal\":{\"name\":\"Challenges of the Internet of Things\",\"volume\":\"216 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-03-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Challenges of the Internet of Things\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/9781119549765.ch4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Challenges of the Internet of Things","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/9781119549765.ch4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enabling Fast-prototyping of Connected Things using the WiNo*Family
In order to be able to deploy the various solutions for the Device Layer of the Internet of Things, these proposals must be evaluated in terms of performance, scalability and repeatability. This paper introduces our test platform which was designed to be able to support these types of tests. We describe the wireless nodes which make up the test platform and present a selection of use cases.
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