一种新的5GHz低噪声放大器的BIST方案

Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. Pub Date : 2004-05-23 DOI:10.1109/ETSYM.2004.1347625

J. Ryu, Bruce C. Kim, I. Sylla

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引用次数: 13

摘要

提出了一种新型的低成本内置自检电路，用于测量5GHz低噪声放大器(LNA)的增益、噪声系数和输入阻抗。BIST电路采用0.18 μ m SiGe技术设计。测试技术利用输入阻抗匹配和输出瞬态电压测量。这项技术简单而廉价。

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A new BIST scheme for 5GHz low noise amplifiers

This paper presents a new low-cost Built-In Self-Test (BIST) circuit for measuring gain, noise figure and input impedance of 5GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.

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Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004.

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